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JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Part No: E17W-H52

SKU: 67897705776

4.2
USD437.00 USD470.00

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Ships within 48 hours · Estimated delivery Jul 25 - Jul 30

Description

Part No: E17W-H52

Inventory # A-13912

Made in the USA This AMAT Applied Materials 0100-76130 Sensors Mux Board PCB 0130-76130 Ultima X is used working surplus

img{max-width:100%} Varian Semiconductor VSEA 1243-L6281-302 Pneumatic Angle Valve NW25 A/O Used Working

This UNIT Instruments UFC-8161 is used working surplus

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Part No: E17W-H52JEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items

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